Electron Microscopy Lab.

Electron Microscopy Lab.

Ural Federal University

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!The papers are copyrighted materials. The materials on this Web site are made available for use in research, teaching, and private study, but may not be used for any commercial purpose. Below are some of the papers published in English. For the full list of publications, please go to the Russian version.
  1. Kolosov V.Yu., Schwamm C.L., Gainutdinov R.V., Tolstikhina A.L., Combined TEM-AFM Study of "Transrotational" Spherulites Growing in Thin Amorphous Films, Bulletin of the Russian Academy of Sciences: Physics, 2007, Vol. 71, No. 10, pp. 1442-1446

  2. Kolosov V.Yu., Schwamm C.L., Steeds J.W., Lattice bending in crystallized areas of anodized Ta-O films, Proc. The 16th International Microscopy Congress (IMC16, Sapporo, Japan), 2006, V. 3, p. 1744

  3. Kolosov V.Yu., Veretennikov L.M., TEM studies of the microstructure resulted from amorphous-crystalline transition under electron beam irradiation in chalcogenide-based films, Proc. The 16th International Microscopy Congress (IMC16, Sapporo, Japan), 2006, V. 3, p. 1465

  4. Kolosov V.Yu., Veretennikov L.M., Startseva Yu.B., Schvamm C.L., Electron Microscopy Study of a Chalcogenide-Based Polycrystalline Condensate Microstructure: The Effect of Composition and Thicknesson on Internal Lattice Bending, Semiconductors, Vol. 39, No. 8, 2005, pp. 955-959

  5. Kolosov V., Schwamm C., Gainutdinov R., Tolstikhina A. Combined TEM-AFM studies of “transrotational” spherulites growing in amorphous films, Proc. of 12th Int. Symp. “Nanostructures: Physics and Technology” St. Petersburg, Russia, 2004, p.166-167

  6. Kolosov V. TEM of crystallizing amorphous films: novel "transrotational" structure on the scale micro - meso - nano, Proc. of 13th EMC, Antwerp, 2004, V. II, p. 255-256

  7. Kolosov V., Gainutdinov R., Schwamm C., TolstikhinaA. Combination of TEM and AFM: microstructure of spherulites growing in amorphous films, Proc. of 13th EMC, Antwerp, 2004, V. II, p. 253-254

  8. V.Yu. Kolosov, L. M. Veretennikov Electron microscopy investigation of the influence of thickness on crystal growth in amorphous films of selenium and antimony compounds Surface investigation, 2001, Vol. 16, pp. 361-367

  9. Kolosov V. Yu. and Tholen A. R. Transmission electron microscopy studies of the specific structure of crystals formed by phase transition in iron oxide amorphous films, Acta Mater. (2000) 48, 1829-1840

  10. Kolosov V.Yu., Tholen A.R., Regularly bent nanocrystals formed in an amorphous film of Fe2O3, Nanostructured Materials, 1997, v. 9, p.323-326.

  11. Kolosov V.Yu., Veretennikov L.M., Kuzmin A.A., Mamaev V.A. Tem study of lattice bending in Sb2Se3 crystals grown in amorphous films, ICEM-13, Paris, 1994, V. 2a, p. 397-398

  12. Kolosov V.Yu. Possibilities of the bend-contour method in the analysis of the lattice disorientations in crystals on thin-film transformations, Proceedings of the ХIIth International Congress for Electron Microscopy, 1990, Seattle, p.574-575

  13. Kolosov V. Yu. ТЕМ studies of unusual lattice bending in the crystallites formed in amorphous films by electron beam, EUREM 92, Electron Microscopy, V 2, Granada, Spain, 1992, p. 513-514

  14. Bolotov I.E., Kolosov V.Yu, Malkov V.B., Electron microscopy investigation of crystals based on bend-contour arrangement III (formation of subgrain boundaries in dislocation-free crystals of selenium), Phys. stat. sol. V. 95, 1986, p. 377-383

  15. Bolotov I.E., Kolosov V.Yu, Kozhin A.V., Electron microscopy investigation of crystals based on bend-contour arrangement II (Bending phenomena of the crystal growth in an amorphous films), Phys. stat. sol., V. 72, 1982, p. 645-654

  16. Bolotov I.E., Kolosov V.Yu, Electron microscopy investigation of crystals based on bend-contour arrangement I (Relations between bend-contour arrangement and bend geometry) Phys. stat. sol. V. 69, 1982, p. 85-96